Aberration correction for low voltage optimized transmission electron microscopy
نویسندگان
چکیده
منابع مشابه
Progress in aberration-corrected high-resolution transmission electron microscopy using hardware aberration correction.
The design and construction of a double-hexapole aberration corrector has made it possible to build the prototype of a spherical-aberration corrected transmission electron microscope dedicated to high-resolution imaging on the atomic scale. The corrected instrument, a Philips CM200 FEG ST, has an information limit of better than 0.13 nm, and the spherical aberration can be varied within wide li...
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A novel imaging mode for high-resolution transmission electron microscopy is described. It is based on the adjustment of a negative value of the spherical aberration C S of the objective lens of a transmission electron microscope equipped with a multipole aberration corrector system. Negative spherical aberration applied together with an overfocus yields high-resolution images with bright-atom ...
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The scanning transmission electron microscope (STEM) has been able to image individual heavy atoms in a light matrix for some time. It is now able to do much more: it can resolve individual atoms as light as boron in monolayer materials; image atomic columns as light as hydrogen, identify the chemical type of individual isolated atoms from the intensity of their annular dark field (ADF) image a...
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ژورنال
عنوان ژورنال: MethodsX
سال: 2018
ISSN: 2215-0161
DOI: 10.1016/j.mex.2018.08.009